基于软件开发过程度量的软件安全性缺陷预测方法及装置
Date:2020-12-09 clicks:
Affilication of Author(s):扬州大学
School Sign:扬州大学
Patent Applicant:刘源
Patent description:基于软件开发过程度量的软件安全性缺陷预测方法及装置
Type of Patent:发明
Application Number:202010286267.7
Number of Inventors:7
Service Invention or Not:no
Application Date:2020-04-13
Authorization Date:2023-04-07
First Author:Liu Yuan