Affiliation of Author(s):电气与能源动力工程学院
Journal:MICROELECTRONICS RELIABILITY
Co-author:任柏桥,薛玉雄,周敏,曹荣幸,陈鹏辉,曾祥华
First Author:LY
Correspondence Author:刘洋
Volume:127
ISSN No.:0026-2714
Translation or Not:no
Date of Publication:2021-01-01